Henrietta-based Pictometry International Corp. said it has been awarded a foundational United States patent for a unique technology that could significantly impact the roof-measurement industry.
The company said the technology will be used to accurately calculate the area of vertical pitched surfaces from oblique aerial photography.
Pictometry’s roof-measurement services are used by insurers, independent adjusters, contractors and homeowners to obtain details about rooftops via a computer or smartphone.
“Our customers have come to expect and rely on Pictometry’s intellectual property leadership stretching back to the earliest days of the company,” CEO Richard Hurwitz said in a statement. “That now includes measuring areas of roof facets and walls, in addition to image capture, oblique image database storage and retrieval; and obtaining accurate measurements of distance, height, elevation and area.”
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